Commit graph

5 commits

Author SHA1 Message Date
Artem Bityutskiy
7163cea15f MTD: tests: add mtd_stresstest
This test just performs random operations on random eraseblocks.

Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
2008-12-08 13:56:14 +02:00
Artem Bityutskiy
72069be936 MTD: tests: add mtd_speedtest
This test examines I/O speed of the flash device.

Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
2008-12-08 13:56:14 +02:00
Artem Bityutskiy
72091b6889 MTD: tests: add mtd_readtest
A simple tests which reads whole MTD device one page at a time.

Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
2008-12-08 13:56:14 +02:00
Artem Bityutskiy
e73f217439 MTD: tests: add mtd_pagetest
This test checks that NAND pages read/write work fine.

Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
2008-12-08 13:56:14 +02:00
Artem Bityutskiy
e3644da756 MTD: tests: add mtd_oobtest
This test checks that OOB of a NAND MTD device works fine.

Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
2008-12-08 13:56:13 +02:00